Antirandom Test Patterns Generation Tool

Random testing is a well known concept that each test is selected randomly regardless of the test previously applied. This paper introduces the antirandom testing which each test applied is chosen such that its total distance from all previous tests is maximum. And one automatic test patterns generation tool using this concept is implemented. At the same time, one popular test generation and simulation tool Nemesis is used to simulate the test patterns generated from Random testing, Antirandom testing and Nemesis which used the Boolean satis ability method, by comparing their fault coverage for stuck-at and bridgeIDDQ in some Benchmark circuits, the advantages and disadvantages in these three methods are obvious, the suitable situation for each method can be easily found.